TFT-LCD Defect Detection Using Multi-level Threshold and Probability Density Function
نویسندگان
چکیده
منابع مشابه
Defect Detection of TFT-LCD Image Using Adapted Contrast Sensitivity Function and Wavelet Transform
The thin film transistor liquid crystal display (TFT-LCD) image has nonuniform brightness, which is a major difficulty in finding the Mura defect region. To facilitate Mura segmentation, globally widely varying background signal must be flattened and then Mura signal must be enhanced. In this paper, Mura signal enhancement and background-signalflattening methods using wavelet coefficient proces...
متن کاملAutomatic Detection of Region-Mura Defect in TFT-LCD
Visual defects, called mura in the field, sometimes occur during the manufacturing of the flat panel liquid crystal displays. In this paper we propose an automatic inspection method that reliably detects and quantifies TFT-LCD regionmura defects. The method consists of two phases. In the first phase we segment candidate region-muras from TFT-LCD panel images using the modified regression diagno...
متن کاملNonuniform Defect Detection of Cell Phone TFT-LCD Display
Uneven and Nonuniformity (Mura) of Thin Film Transistor Liquid Crystal Display (TFT-LCD) is a major problem of cell phone display. The different types of uneven and nonuniformity are decreased the performance of TFT-LCD. To economize and increase its performance, it is necessary to detect these kinds of defects. The cause of these types of noisy defects can be stimulated by the material of TFT,...
متن کاملAutomatic TFT-LCD Mura Defect Detection using Gabor Wavelet Transform and DCT
Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet t...
متن کاملAutomatic Defect Detection for TFT-LCD Array Process Using Quasiconformal Kernel Support Vector Data Description
Defect detection has been considered an efficient way to increase the yield rate of panels in thin film transistor liquid crystal display (TFT-LCD) manufacturing. In this study we focus on the array process since it is the first and key process in TFT-LCD manufacturing. Various defects occur in the array process, and some of them could cause great damage to the LCD panels. Thus, how to design a...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Korean Institute of Intelligent Systems
سال: 2009
ISSN: 1976-9172
DOI: 10.5391/jkiis.2009.19.5.615